On Defects, they've shown around the micron scale that they add no new defects towards the layer transferred towards the SmartSiC, nonetheless potential perform to extend that to the full wafer would supply certainty on the macro pattern. The opportunity for unbiased validation of those substrates would allay any remaining https://x.com/Anumhsite/status/1809241427484053971
The Best Side of single crystal silicon carbide
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